A Novel Goodness of Fit Test Spectrum Sensing Using Extreme Eigenvalues, LI He, Zhao Wenjing, Liu Chang, Jin Minglu, Yoo Sang-Jo, Chinese Journal of Electronics, 2020
작성자 관리자날짜 2021-04-21 15:21:20
A Novel Goodness of Fit Test Spectrum Sensing Using Extreme Eigenvalues, LI He, Zhao Wenjing, Liu Chang, Jin Minglu, Yoo Sang-Jo, Chinese Journal of Electronics, 2020